Resolving Nano Scale Recording Bits on Phase-Change Rewritable Optical Disk
Abstract
We use a new imaging method to resolve the nano scale recording bits on phase-change rewritable optical disks. By this method, several kinds of nano scale recording bits on different phase-change optical disks can be clearly imaged without any painstaking or expensive procedures. With the conductive-atomic force microscopy (C-AFM) images of nano scale recording bits on phase-change materials, we can study the properties of phase-change recording layers and the recording bit formation mechanism comprehensively.
- Publication:
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Japanese Journal of Applied Physics
- Pub Date:
- February 2006
- DOI:
- 10.1143/JJAP.45.1431
- Bibcode:
- 2006JaJAP..45.1431L