Intrinsic Reliability of AlOx-Based Magnetic Tunnel Junctions Akerman, J. ; Deherrera, M. ; Slaughter, J. M. ; Dave, R. ; Sun, J. J. ; Martin, J. T. ; Tehrani, S. Abstract Publication: IEEE Transactions on Magnetics Pub Date: October 2006 DOI: 10.1109/TMAG.2006.879735 Bibcode: 2006ITM....42.2661A