Radiation-Induced Multi-Bit Upsets in SRAM-Based FPGAs Quinn, H. ; Graham, P. ; Krone, J. ; Caffrey, M. ; Rezgui, S. Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: December 2005 DOI: 10.1109/TNS.2005.860742 Bibcode: 2005ITNS...52.2455Q