Exploring the Limits of Stress-Enhanced Hole Mobility Smith, L. ; Moroz, V. ; Eneman, G. ; Verheyen, P. ; Nouri, F. ; Washington, L. ; Jurczak, M. ; Penzin, O. ; Pramanik, D. ; Demeyer, K. Abstract Publication: IEEE Electron Device Letters Pub Date: September 2005 DOI: 10.1109/LED.2005.853668 Bibcode: 2005IEDL...26..652S