Measurement of magnetic relaxation in the peak regime of V 3Si

Magnetization relaxation measurements are carried out in the peak effect regime of superconducting V ₃Si crystal, using Quantum Design SQUID magnetometer. Relaxation in the increasing field scan is logarithmic in time, consistent with the theory of flux creep. The relaxation on the decreasing field scan however exhibits athermal behavior which is predominantly governed by the flux avalanches triggered by the small external field perturbation experienced by the superconductor during measurement scan in an inhomogeneous field.