Nodal Order Parameter in Electron-Doped Pr2-xCexCuO4-δ Superconducting Films
Abstract
The London penetration depth, λab(T), is reported for thin films of the electron-doped superconductor Pr2-xCexCuO4-δ with varying Ce concentration, x=0.13, 0.15, and 0.17. Measurements down to 0.35K were carried out using a tunnel-diode oscillator with excitation fields applied both perpendicular and parallel to the conducting planes. Films at all three doping levels exhibited power law behavior indicative of d-wave pairing with impurity scattering. These results are fully consistent with previous measurements on single crystals.
- Publication:
-
Physical Review Letters
- Pub Date:
- April 2004
- DOI:
- 10.1103/PhysRevLett.92.157005
- Bibcode:
- 2004PhRvL..92o7005S
- Keywords:
-
- 74.25.Nf;
- 74.72.Jt;
- Response to electromagnetic fields;
- Other cuprates including Tl and Hg-based cuprates