Electron-Phonon Scattering in Metallic Single-Walled Carbon Nanotubes
Abstract
Electron scattering rates in metallic single-walled carbon nanotubes are studied using an atomic force microscope as an electrical probe. From scaling of the resistance of the same nanotube with length in the low and high bias regimes, the mean free paths for both regimes are inferred. The observed scattering rates are consistent with calculations for acoustic phonon scattering at low biases and zone boundary/optical phonon scattering at high biases. This presentation is sponsored by DCOMP. This work was supported by the NSF Center for Nanoscale Systems, the Packard Foundation, the MARCO/DARPA FRC-MSD, and the Cornell Center for Materials Research.
- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 2004
- Bibcode:
- 2004APS..MARY16005R