Correlating quantum decoherence and material defects in a Josephson qubit
Abstract
Superconducting tunnel junction devices are promising candidates for constructing quantum bits (qubits) for quantum computation because of their inherently low dissipation and ease of scalability by microfabrication. Recently, the Josephson phase qubit has been characterized spectroscopically as having spurious microwave resonators that couple to the qubit and act as a dominant source of decoherence. While the origin of these spurious resonances remains unknown, experimental evidence points to the material system of the tunnel barrier. Here, we focus on our materials research aimed at elucidating and eliminating these spurious resonators. In particular, we have studied the use of high quality Al films epitaxially grown on Si(111) as the base electrode of the tunnel junction. During each step in the Al/AlOx/Al trilayer growth, we have investigated the structure in situ by AES, AED and LEED. While tunnel junctions fabricated with these epitaxial base electrodes prove to be of non-uniform oxide thickness and too thin, I-V characteristics have shown a lowering of subgap currents by a factor of two. Transport measurements will be correlated with morphological structure for a number of devices fabricated with various degrees of crystalline quality.
- Publication:
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APS March Meeting Abstracts
- Pub Date:
- March 2004
- Bibcode:
- 2004APS..MARA37012H