The Development of the High-Resolution Transmission Electron Microscope (HRTEM) Combined with AFM for Simultaneous Observation of Structure and Force of the Nanocontact
Abstract
A high-resolution transmission electron microscope combined with an atomic force microscope (HRTEM-AFM) has been developed. It enables us to observe mechanical force and atomic structure of nanowires formed at the nanocontact simultaneously. And the self-sensing piezoresistive cantilever is used as an AFM probe in the HRTEM-AFM. It has high spatial resolution of 0.2nm and high force sensitivity of sub-nN. The HRTEM has also ability to work on ultra high vacuum(UHV) which is necessary to keep the nanocontact clean. The present system could never be developed without total redesigning of the goniometer stage of UHV-TEM which operates at 10-8 Pa.
- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 2004
- Bibcode:
- 2004APS..MAR.K1065S