Probing proton damage in soi cmos technology by using lateral bipolar action Li, Ying ; Niu, Guofu ; Cressler, J. D. ; Patel, J. ; Liu, Mike ; Mojarradi, M. M. ; Reed, R. A. ; Marshall, P. W. ; Blalock, B. J. Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: December 2003 DOI: 10.1109/TNS.2003.822088 Bibcode: 2003ITNS...50.1885L