Effects of uniaxial mechanical stress on drive current of 0.13 μm MOSFETs Wang, Y. G. ; Scott, D. B. ; Wu, J. ; Waller, J. L. ; Hu, J. ; Liu, K. ; Ukraintsev, V. Abstract Publication: IEEE Transactions on Electron Devices Pub Date: February 2003 DOI: 10.1109/TED.2002.808450 Bibcode: 2003ITED...50..529W