Monte Carlo Simulation of Noise in Electronic Devices: Limitations and Perspectives
Abstract
We review the main problems met by the Monte Carlo technique when dealing with the study of noise in electronic devices. We also summarize the major challenges in the noise analysis associated with the continued evolution of electronic devices that could be addressed in the future through Monte Carlo simulations.
- Publication:
-
Unsolved Problems of Noise and Fluctuations: UPoN 2002
- Pub Date:
- May 2003
- DOI:
- Bibcode:
- 2003AIPC..665..496G
- Keywords:
-
- 85.30.De;
- 85.35.-p;
- Semiconductor-device characterization design and modeling;
- Nanoelectronic devices