A Next Generation Imaging Filter for High Voltage Electron Microscopy Moonen, D. ; Trevor, C. ; Chew, D. ; Hunt, J. ; Mooney, P. E. ; Brink, H. A. Abstract Publication: Microscopy and Microanalysis Pub Date: August 2002 DOI: 10.1017/S143192760210609X Bibcode: 2002MiMic...8S.630M