Current distribution in a reusable junction for W7-X coil tests Schild, T. ; Germain, J. ; Berton, J. B. ; Dupont, B. ; Forgeas, A. Abstract Publication: IEEE Transactions on Applied Superconductivity Pub Date: March 2002 DOI: 10.1109/TASC.2002.1018644 Bibcode: 2002ITAS...12.1313S