High resolution magnetic force microscopy using focused ion beam modified tips
Abstract
Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an extremely high aspect ratio of greater than 30:1, and an end radius of less than 25 nm. These tips have been used in a commercial atomic force microscope under ambient conditions to obtain 30 nm resolution magnetic images of an established CoNi/Pt multilayer reference sample.
- Publication:
-
Applied Physics Letters
- Pub Date:
- July 2002
- DOI:
- 10.1063/1.1497434
- Bibcode:
- 2002ApPhL..81..865P
- Keywords:
-
- magnetic force microscopy;
- atomic force microscopy;
- cobalt;
- magnetic thin films;
- magnetic anisotropy;
- Anisotropy;
- Atomic Force Microscopy;
- Cobalt;
- High Resolution;
- Ion Beams;
- Magnetic Films;
- Magnetic Moments;
- Magnetic Properties;
- Microscopy;
- Thick Films;
- 07.79.Pk;
- 07.79.Lh;
- 75.70.Ak;
- 75.30.Gw;
- Instrumentation and Photography;
- Magnetic force microscopes;
- Atomic force microscopes;
- Magnetic properties of monolayers and thin films;
- Magnetic anisotropy