Characterization of Environmentally Passive Films Grown on Zirconium Surfaces
Abstract
Due to a protective oxide film that grows on its surface, zirconium and its alloys are corrosion resistant to harsh environments and therefore useful in many chemical and nuclear applications. We use variable angle infrared (IR) reflection spectroscopy and atomic force microscopy (AFM) to determine the thickness and morphology of such films grown thermally in air over the temperature range 773 - 873 K. For the pure zirconium and Zircaloy-2 systems studied, the density and homogeneity of the oxide films as well as the thickness depends on annealing time and temperature. In both cases we find that the film growth follows cubic rate law kinetics, and for Zircaloy-2 we are able to extract an apparent activation energy of 227 kJ/mol for the film growth.
- Publication:
-
APS Ohio Sections Spring Meeting Abstracts
- Pub Date:
- April 2002
- Bibcode:
- 2002APS..OSS.B1002F