Epitaxial Pb(Zr, Ti)O3 thin films with coexisting tetragonal and rhombohedral phases
Abstract
Epitaxial Pb(Zr, Ti)O3 thin films having coexisting tetragonal and rhombohedral phases have been successfully fabricated with the film compositions that correspond to the Zr-rich region of the morphotropic phase boundary (MPB). The key to the present success is to quantitatively understand the shift of the MPB under a film stress. The present fabrication has been theoretically justified by superimposing the computed temperature-dependent film stress on the theoretical temperature-stress (T-S) phase diagram and by delineating a probable phase-transition path upon cooling the film from the processing temperature.
- Publication:
-
Physical Review B
- Pub Date:
- April 2001
- DOI:
- 10.1103/PhysRevB.63.132101
- Bibcode:
- 2001PhRvB..63m2101H
- Keywords:
-
- 68.55.-a;
- 77.55.+f;
- 77.80.Bh;
- 77.84.Dy;
- Thin film structure and morphology;
- Dielectric thin films;
- Phase transitions and Curie point;
- Niobates titanates tantalates PZT ceramics etc.