Electron detachment of Si- by He, Ne, and Ar
Abstract
The cross sections for electron detachment of Si- were measured for He, Ne, and Ar targets at relative velocities in the 0.25-1.4 a.u. range. Argon target cross sections were measured using Si- ions from two different origins, the results agreeing well with each other and with literature values. The velocity dependence of the Si- cross sections is strikingly similar to that of known H- results, with the former being consistently larger than the latter and, at large velocities, differing by a multiplicative constant.
- Publication:
-
Physical Review A
- Pub Date:
- February 2001
- DOI:
- 10.1103/PhysRevA.63.022705
- Bibcode:
- 2001PhRvA..63b2705L
- Keywords:
-
- 34.50.Fa;
- 34.90.+q;
- Electronic excitation and ionization of atoms;
- Other topics in atomic and molecular collision processes and interactions