Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications
Abstract
Spatially resolved spectroscopic measurements with a 10 and 20 μm pencil beam have been performed on a monolithic 7-element Silicon-Drift-Detector (SDD). Detailed studies are shown of the modification of the spectroscopic response at pixel edges and pixel centre. The results give quantitative insight into the local SDD performance. A simple model predicts global properties (e.g. peak-to-background ratio) of larger SDD arrays, like the 61-element detector currently under development.
- Publication:
-
Nuclear Instruments and Methods in Physics Research A
- Pub Date:
- July 2001
- DOI:
- 10.1016/S0168-9002(01)00586-1
- Bibcode:
- 2001NIMPA.467.1163K
