Reflectivity studies on a synchrotron radiation mirror in the hard X-ray regime
Abstract
The optical performance and roughness parameters of an X-ray mirror that was used for several years in a synchrotron radiation beamline are determined by studying its X-ray reflectivity and diffuse scattering behavior. These values are compared to the data derived from topographic measurements with an atomic force microscope (AFM).
- Publication:
-
Nuclear Instruments and Methods in Physics Research A
- Pub Date:
- July 2001
- DOI:
- 10.1016/S0168-9002(01)00304-7
- Bibcode:
- 2001NIMPA.467..275K