Measurement of the Extended X-ray Raman Fine Structure (XRFS) for Diamond Using a Filter Based Analyzer
Abstract
Non-resonant x-ray Raman scattering is the inelastic scattering of hard x-rays from the core electrons of low-Z elements. Within certain assumptions, the x-ray Raman fine structure (XRFS) and x-ray absorption fine structure (XAFS) are characterized by the same photoelectron transition matrix elements. XRFS and soft x-ray XAFS therefore provide similar local structural information. However, XRFS has bulk rather than surface sensitivity, and has fewer experimental constraints on the local atomic and overall sample environments. Whereas all previous measurements of XRFS have used bent crystal analyzers, we report the first measurement of XRFS with a filter based analyzer. Our analyzer has an 0.3 sr collection angle, a 7 percent detection efficiency, and a 3.5 eV energy resolution, yielding performance comparable to that of bent crystal analyzers. We will present XRFS results for diamond and other low-Z materials, and discuss applications of XRFS measurement ranging from organic materials to transition metal oxides.
- Publication:
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APS March Meeting Abstracts
- Pub Date:
- March 2001
- Bibcode:
- 2001APS..MARV32006B