Direct Near-Field Optical Measurements of the Super-Resolution Near-Field Optical Structure
Abstract
Direct experimental observation of the near-field optical properties in the super resolution near-field structure of glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) has been achieved using a tapping-mode tuning-fork near-field scanning optical microscope. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super resolution structure. Images of the near-field intensity gradients at different excited laser powers (0.45-2.33 μW) demonstrated that the area had the static evanescent intensity could be stably controlled.
- Publication:
-
Near-Field Optics: Principles and Applications - Proceedings of the Second Asia-Pacific Workshop. Edited by XING ZHU ET AL. Published by World Scientific Publishing Co. Pte. Ltd
- Pub Date:
- 2000
- DOI:
- 10.1142/9789812792556_0035
- Bibcode:
- 2000nfop.conf..234T