X-ray Measurement of a Microdistortion Tensor and Its Application in an Analysis of the Dislocation Structure of Thick GaN Layers Obtained by Hydrochloride Gaseous-Phase Epitaxy
Abstract
- Publication:
-
Physics of the Solid State
- Pub Date:
- December 2000
- DOI:
- 10.1134/1.1332141
- Bibcode:
- 2000PhSS...42.2204R