Dielectric Relaxation in Bi12SiO20 : Cr Crystals
Abstract
A study is reported of the temperature and frequency dependences of the permittivity and losses in Cr-doped Bi12SiO20 crystals at sonic frequencies and in the range 300–800 K. A number of dielectric anomalies and a close-to-linear Cole-Cole diagram have been observed. The results are discussed by invoking the concepts of electron hopping and screening of the induced polarization through the relaxation of local lattice distortions.
- Publication:
-
Physics of the Solid State
- Pub Date:
- April 2000
- DOI:
- 10.1134/1.1131271
- Bibcode:
- 2000PhSS...42..689P
- Keywords:
-
- Spectroscopy;
- State Physics;
- Frequency Dependence;
- Dielectric Relaxation;
- Lattice Distortion