Cryogenic test facility of the D.V. Efremov Institute Glukhikh, V. A. ; Filatov, O. G. ; Belyakov, V. A. ; Egorov, S. A. ; Korsunsky, V. E. ; Rodin, I. Y. Abstract Publication: IEEE Transactions on Applied Superconductivity Pub Date: March 2000 DOI: 10.1109/77.828542 Bibcode: 2000ITAS...10.1564G