Near-field Surface Enhanced Raman Scattering from Single Wall Carbon Nanotubes
Abstract
Raman spectroscopy has become a powerful tool for the characterization of single wall carbon nanotubes (SWNTs). Here we show that near-field surface enhanced Raman scattering techniques can be used to obtain the spectral signatures of small SWNT bundles,individual long and short tubes,as well as of defects on the SWNT walls. Samples for surface enhancement studies are obtained by depositing a silver film on optical quality glass by the reduction of Tollen's reagent, with colloidal silver features of the order of 40 to 150 nm. The silver film on glass was dipped for up to 30 min. in an aqueous suspension of laser-grown SWNTs prepared by extended sonication. Near-field surface enhanced Raman scattering at a spatial resolution of 136 and 160 nm was carried out on the assembled SWNTs on the silver film, using solid immersion lenses (SILs) composed of ZnS and Schott glass, respectively. New SWNT Raman spectral features were observed, which are interpreted in terms of the calculated spectra for individual and bundled SWNTs of different sizes.
- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 2000
- Bibcode:
- 2000APS..MARV10002I