Internal Optical Fields of Single Mode Devices
Abstract
Near-field scanning optical microscopy has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides, microring resonators, and photonic band-gap devices. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured modal shape determines the values of all spatial components of the wave vector. Experimental results addressing the issue of perturbation of the NSOM probe on the measurement of the local field shows a weak but measurable perturbation, and the dependence on coated or uncoated tips show that the collection is dominated by scattering and not by phase-matched propagation from the guide to the tip.
- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 2000
- Bibcode:
- 2000APS..MARG32006G