Coverage dependence of the structure of Si deposited layers on a Si(001) surface investigated by reflection electron microscopy
Abstract
The structure of Si layers deposited on a Si(001) 2×1 surface at room temperature is investigated by reflection electron microscopy. After the sample heating by direct current, the structure of the deposited layer returns to the 2×1 surface at coverages below 1 monolayer (ML), but changes to a rough surface with the 2×1 and the 1×2 domains at coverages above 1 ML. Since the vacancies exist in the deposited layer at coverages below 1 ML, these vacancies will accelerate the recovery process of the 2×1 surface by enhancing adsorbate migration.
- Publication:
-
Surface Science
- Pub Date:
- May 1999
- DOI:
- 10.1016/S0039-6028(99)00172-7
- Bibcode:
- 1999SurSc.426....1D