X-Ray diffraction analysis of multilayer InAs-GaAs heterostructures with InAs quantum dots Faleev, N. N. ; Egorov, A. Yu. ; Zhukov, A. E. ; Kovsh, A. R. ; Mikhrin, S. S. ; Ustinov, V. M. ; Pavlov, K. M. ; Punegov, V. I. ; Tabuchi, M. ; Takeda, Y. Abstract Publication: Semiconductors Pub Date: November 1999 DOI: 10.1134/1.1187855 Bibcode: 1999Semic..33.1229F