Raman and RAS Measurements on Uniaxially Strained Thin Semiconductor Layers
Abstract
Available from http://www3.interscience.wiley.com/cgi-bin/abstract/40003534/START
- Publication:
-
Physica Status Solidi B Basic Research
- Pub Date:
- January 1999
- DOI:
- 10.1002/(SICI)1521-3951(199901)211:1<309::AID-PSSB309>3.0.CO;2-W
- Bibcode:
- 1999PSSBR.211..309L