Band gap determination in thick films from reflectance measurements
Abstract
Spectroscopic techniques are very useful for characterising semiconducting materials. We demonstrate here a new formulation and method for measuring the energy band gap in thick films from the reflectance data.
- Publication:
-
Optical Materials
- Pub Date:
- May 1999
- DOI:
- Bibcode:
- 1999OptMa..12..115K