An important mechanism of crop breeding with ultralow energy ion implantation
Abstract
The characteristic X-rays excited in carbon compounds of seeds by ultralow energy (110 keV) ions implanted in wheat seeds were simulated with carbon-light of synchrotron-radiation. After the seeds were irradiated with the C-light, the through-germination survival fraction of the seeds and the micronucleus frequency in their root-tip cells could be measured. The data verify that the characteristic X-rays excited by the ultralow energy ions implanted in the seeds provide an important mechanism of crop breeding.
- Publication:
-
Nuclear Instruments and Methods in Physics Research B
- Pub Date:
- February 1998
- DOI:
- 10.1016/S0168-583X(98)00507-2
- Bibcode:
- 1998NIMPB.134..191W