SEB occurrence in a VIP: Influence of the epi-substrate junction Lorfevre, E. ; Sudre, C. ; Dachs, C. ; Detcheverry, C. ; Palau, J. -M. ; Gasiot, J. ; Calvet, M. -C. ; Garnie, J. ; Ecoffet, R. Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: June 1998 DOI: 10.1109/23.685250 Bibcode: 1998ITNS...45.1624L