Preliminary investigation of the SXR emission in various RFX plasma conditions
Abstract
In RFX, the SXR tomographic system has been installed and extensively operated during the last experimental campaigns. The 78 channels, the high time resolution and the opportunity to change the beryllium filters in front of the detectors on the shot to shot basis provide the required flexibility to analyse the SXR radiation in practically all the various plasma regimes. A thorough investigation of the line integrated profiles has been performed at steady-state, in order to determine the major dependencies of the SXR radiation from the main plasma parameters. Inverted profiles have also been analysed, in order to better resolve the spatial details of the emissivity. The SXR response to sudden plasma variations induced from the exterior, like pellets, impurity injections and PPCD, have been examined and compared with the data of other diagnostics. Some initial results of tomogharphic inversions are reported, together with the most important steps which are needed to improve the reliability of the diagnostic.
- Publication:
-
APS Division of Plasma Physics Meeting Abstracts
- Pub Date:
- November 1998
- Bibcode:
- 1998APS..DPP.F3P24M