Survey of Structural Evolution in Carbonic Materials By First Order Raman Spectrum; Comparison to X-Ray Diffractometry Data
Abstract
Relative heights of "defective" bands in the Raman spectrum of carbonic materials are sensitive parameters towards structural transformations happening in the sample. Raman microspectrometry and X-ray diffractometry information are used to study the correlation between structural evolution and the reduction of defects.
- Publication:
-
Turkish Journal of Physics
- Pub Date:
- April 1997
- Bibcode:
- 1997TJPh...21..559A