Distribution of a shallow donor impurity in a p-type CdTe wafer annealed in Cd vapors Babentsov, V. N. ; Vlasenko, Z. K. ; Vlasenko, A. I. ; Lyubchenko, A. V. Abstract Publication: Semiconductors Pub Date: May 1997 DOI: 10.1134/1.1187189 Bibcode: 1997Semic..31..441B