Surface layer composition of ion bombarded spinel crystals
Abstract
Single crystals of MgO·Al 2O 3 and MgO·2Al 2O 3 as well as MgAl 2O 4 ceramics were bombarded with H + and Ar + ions of 1.2 keV. Investigations of the ion-induced changes of composition versus fluence in the range 10 16-10 18 ions/cm 2 were performed. Using X-ray photoelectron spectroscopy we measured ratios of atoms Mg/Al and O/Al at different fluences and temperatures. The results indicate the importance of surface binding energy of constituent atoms in spinel, density of radiation defects created by incident ions, thermal and radiation enhanced diffusion in formation of surface layer composition of spinel.
- Publication:
-
Nuclear Instruments and Methods in Physics Research B
- Pub Date:
- May 1997
- DOI:
- 10.1016/S0168-583X(96)01131-7
- Bibcode:
- 1997NIMPB.127..612G