Recording studies of sub-micron write heads by focused ion beam trimming Gorman, G. L. ; Vo, Lang ; Hu, B. H. L. ; Tsang, Ching ; Cser, J. ; Lindquist, J. Abstract Publication: IEEE Transactions on Magnetics Pub Date: September 1997 DOI: 10.1109/20.617744 Bibcode: 1997ITM....33.2824G