Raman microprobe analysis of patterned Tl-2212 thin films Myers, K. E. ; Walls, D. J. ; Wilker, C. ; Pang, P. S. W. ; Carter, C. F. Abstract Publication: IEEE Transactions on Applied Superconductivity Pub Date: June 1997 DOI: 10.1109/77.621012 Bibcode: 1997ITAS....7.2126M