Space Charge Effect in Secondary Electron Monitors
Abstract
Phase or spatial resolution of secondary electron monitors for, respectively, longitudinal or trasverse bunch charge distribution measurements are restricted by the space charge effect of both a primary beam and secondary electron one. Simulation results of the effect in the monitors in an approach of ellipsoidal bunches of the primary beam with uniform charge density and taking into account the field of charges induced by the beam on the wire target of the monitor and its conducting wall installed near the beam will be presented.
- Publication:
-
APS Meeting Abstracts
- Pub Date:
- May 1997
- Bibcode:
- 1997APS..PAC..8P62T