Micro-discharge at strip edge of silicon microstrip sensors

We have investigated the micro-discharge (micro-breakdown) phenomenon which is potentially a serious problem in operating in a high radiation environment. Numerical calculation of field strength for the model structure of the microstrip sensor gives us a quantitative understanding of each different cause of micro-discharge. The structure of the microstrip sensor can be optimized through this field calculation for suppressing the micro-discharge. We propose a new strip structure to suppress the micro-discharge.