Design of a Tandem-Scanning Confocal Microprobe for Raman Spectroscopy
Abstract
The Physics Department Raman microprobe has utilized laser line illumination, via cylindrical optics, for spectroscopic analysis of residual stresses on the surface of materials such as silicon carbide.(J. L. Binford, P. P. Yaney and N. L. Hecht, Bull. Am. Phys. Soc. 41, 1196 (1996)) This design allows for higher illuminating power (thus shortening exposure times and lowering the risk of surface damage) but gives a 2D Gaussian illumination profile which does not permit high spatial resolution of the scattered light. The use of two computer- controlled galvanometer scanners yields uniform illumination along a line on the specimen and allows for higher axial resolution as well as 2D spatial filtering. Introduction of an atomic reference source, binocular viewing optics, and the option to use another scanning spectrometer with PMT detection were additional considerations in this design effort. Computer simulation using commercial optical ray tracing software aided the optimization of design parameters.
- Publication:
-
APS Meeting Abstracts
- Pub Date:
- November 1996
- Bibcode:
- 1996APS..OFM..CH01Z