Critical Current Measurements of In-situ TlPb-1212 Thin Films
Abstract
We report measurements of the critical current and surface resistance of yttrium-doped TlPb-1212. These Tl_0.5Pb_0.5Sr_2Ca_x-1Y_xCu_2O7 thin films were grown in-situ by off-axis sputtering in the presence of Tl_2O vapor. The films are highly epitaxial and smoother than thallium cuprate films grown by the more standard two-step process. Standard photolithography and ion-milling were used to pattern the films for critical current measurements.
- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 1996
- Bibcode:
- 1996APS..MAR.S2406M