Influence of UV damage on the dark current and detection limit for a photodiode array detector
Abstract
UV irradiation of a commercial photodiode array using low intensity 253.7 nm radiation leads to a permanent linear increase in the dark current and a deterioration in the detectability limit of the device. Considerable modification of the temperature dependence of the dark current of the device is also observed.
- Publication:
-
Nuclear Instruments and Methods in Physics Research A
- Pub Date:
- February 1995
- DOI:
- 10.1016/0168-9002(95)00348-7
- Bibcode:
- 1995NIMPA.364..166A