A microwave scanning surface harmonic microscope using a re-entrant resonant cavity Bordoni, F. ; Yinghua, Li ; Spataro, B. ; Feliciangeli, F. ; Vasarelli, F. ; Cardarilli, G. ; Antonini, B. ; Scrimaglio, R. Abstract Publication: Measurement Science and Technology Pub Date: August 1995 DOI: 10.1088/0957-0233/6/8/017 Bibcode: 1995MeScT...6.1208B