A new electrothermal vaporization device for direct sampling of ceramic powders for inductively coupled plasma optical emission spectrometry
Abstract
In spite of many important advantages of electrothermal vaporization of solid samples combined with inductively coupled plasma spectrometry (ETV-ICP-OES) the method has not been exploited to its full potential as a routine analysis mainly due to unsatisfactory reproducibility. The design of the system which transports the analytes into the plasma is recognized as one of the main factors influencing effective transport. Development of a reliable means of combining an ETV device with an ICP would be very useful when direct analysis of trace elements in ceramic powders is needed. This paper describes the construction of an ETV-ICP system for direct analysis of ceramic powders through in situ thermochemical processing. The system is based on in-line electrical resistive heating of a graphite crucible with powdered silicon carbide mixed with a CoF 2 + BaO modifier in a proportion 1 : 1 : 1. The transport path was shortened to 9 mm from the orifice of the crucible to the bottom of a modified injector tube. No material was deposited on the injector tube based on washing the tube and analyzing the solution by ICP-OES. Initial assessment by peak area integration of emisison signals of 5 mg silicon carbide powder shows that the level of detection lies approximately in pg level for Ti, V, Al and Fe. The system has no memory effect. The ETV unit could be used both by ETV-ICP-OES and ETV-ICP-MS.
- Publication:
-
Spectrochimica Acta - Part B: Atomic Spectroscopy
- Pub Date:
- June 1995
- DOI:
- 10.1016/0584-8547(94)00137-K
- Bibcode:
- 1995AcSpB..50..527N