Tandem limiter optimization
Abstract
The EZ-scan, an improved Z-scan technique, shows a sensitivity for measuring nonlinearly induced wavefront distortion of approximately equals (lambda) /104. We show that the nonlinear refraction and nonlinear absorption coefficients can be determined separately by a single EZ-scan measurement. We describe application of this technique to several organic thin films.
- Publication:
-
Nonlinear Optical Materials for Switching and Limiting
- Pub Date:
- July 1994
- DOI:
- 10.1117/12.179584
- Bibcode:
- 1994SPIE.2229..179H