X-ray diffraction study of the interfaces between Hg1 - xCdxTe crystals and anodic films Galkin, I. M. ; Nefedov, A. A. ; Chaplanov, V. A. ; Shipov, I. A. ; Yakimov, S. S. Abstract Publication: Semiconductors Pub Date: February 1993 Bibcode: 1993Semic..27..134G