Electro-optic characterisation of extremely wide bandwidth electrical signals
Abstract
In this report an ultrafast electro-optic sampling system suitable for applications such as device characterization is described. The aperture time of the sampler is calculated to be about 290 fs, implying an attainable device bandwidth in excess of 300 GHz. The sampler was characterized using a test pulse with approximately 12 GHz of frequency content, and the results compared to those obtained from an 18 GHz digital sampling oscilloscope.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- February 1993
- Bibcode:
- 1993STIN...9330145L
- Keywords:
-
- Apertures;
- Bandpass Filters;
- Broadband;
- Characterization;
- Countermeasures;
- Electro-Optics;
- Laser Applications;
- Light Modulation;
- Optical Communication;
- Oscilloscopes;
- Signal Processing;
- Spread Spectrum Transmission;
- Amplifiers;
- Fourier Transformation;
- Samplers;
- Tunable Lasers;
- Communications and Radar