Ion-channeling analysis of defects in epitaxial films of YBa2Cu3O7 Verbitskaya, E. M. ; Eremin, V. K. ; Konnikov, S. G. ; Strokan, N. B. ; Kobzev, A. P. ; Shirokov, D. M. Abstract Publication: Journal of Technical Physics Pub Date: May 1993 Bibcode: 1993JTePh..38..424V